Testing systems and methods

ABSTRACT

A system of the present disclosure has a host testing device having a first wireless transceiver and having host testing device logic configured to transmit a test command via the first wireless transceiver. Additionally, the system has a remote testing device coupled to a system component. The remote testing device has a second wireless transceiver and remote testing device logic that receives the test command from the host testing device and executes the test command on the system component.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a Continuation of U.S. patent application Ser. No.14/863,207 entitled Testing Systems and Methods and filed on Sep. 15,2015, which claims priority to U.S. Provisional Patent Application Ser.No. 62/054,668 entitled Cable Testing Systems and Methods and filed onSep. 24, 2014 and U.S. Provisional Patent Application Ser. No.62/126,345 entitled System Component Testing Systems and Methods andfiled on Feb. 27, 2015, all of which are incorporated herein byreference.

BACKGROUND

Installation and maintenance tasks typically require technicians todiagnose and/or locate a problem in a complicated system. Thecomplicated system may comprise a myriad of electronics and componentsmaking up subsystems that have numerous interfaces to other electronicsand components or other subsystems. In such a scenario, when a system isnot operating or functioning properly, it is often difficult to locatethe offending subsystem and/or electronics causing a fault in thesystem.

Where a technician is diagnosing issues with a system located “in thefield,” it is often the case that the technician does not have thenecessary information he/she needs to diagnose the problem. In such ascenario, the technician may have to telephone a central office foradditional information. In one scenario, the technician may carry withhim/her physical documents describing the system to use fortroubleshooting purposes. This is a laborious activity in that it wouldbe undesirable for the technician to physically carry all documents thatthe technician may need in order to perform diagnosis and repair of thesystem.

SUMMARY

A system of the present disclosure has a host testing device having afirst wireless transceiver and having host testing device logicconfigured to transmit a test command via the first wirelesstransceiver. Additionally, the system has a remote testing devicecoupled to a system component. The remote testing device has a secondwireless transceiver and remote testing device logic that receives thetest command from the host testing device and executes the test commandon the system component.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure can be better understood with reference to thefollowing drawings. The elements of the drawings are not necessarily toscale relative to each other, emphasis instead being placed upon clearlyillustrating the principles of the disclosure. Furthermore, likereference numerals designate corresponding parts throughout the severalviews.

FIG. 1 depicts an exemplary testing system in accordance with anembodiment of the present disclosure interface with a CH47 helicopter.

FIG. 2 is a block diagram of another exemplary testing system inaccordance with an embodiment of the present disclosure.

FIG. 3 is a block diagram of a single testing device configuration inaccordance with an embodiment of the present disclosure.

FIG. 4 is a block diagram of a host testing device such as is depictedin FIG. 1 .

FIG. 5 is a block diagram of a remote testing device such as is depictedin FIG. 1 .

FIG. 6 is exemplary wiring data for a single testing deviceconfiguration for use by the host testing device depicted in FIG. 4 .

FIG. 7 is exemplary wiring data for a multiple testing deviceconfiguration for use by the host testing device depicted in FIG. 4 .

FIG. 8 is a block diagram of a host testing device such as is depictedin FIG. 4 .

FIG. 9 is a block diagram of exemplary hardware for a host testingdevice such as is depicted in FIG. 4 .

FIG. 10 is a block diagram of exemplary hardware of a host testingdevice such as is depicted in FIG. 4 and a remote testing device such asis depicted in FIG. 5 .

FIG. 11 is a block diagram of the exemplary hardware depicted in FIG. 10further showing an iteration of a test performed with an open switch.

FIG. 12 is a block diagram of the exemplary hardware depicted in FIG. 10further showing another iteration of a test performed.

FIG. 13A is a flowchart depicting exemplary architecture andfunctionality of the host testing device such as is depicted in FIG. 4 .

FIG. 13B is a diagram describing faults that may occur when a cable istested via the host testing device such as is depicted in FIG. 4 .

FIG. 14 is a flowchart depicting an exemplary method for downloading atest program to the host testing device of FIG. 4 .

FIG. 15A is a front perspective view of a testing device of FIG. 4 .

FIG. 15B is a side view of the testing device of FIG. 15A.

FIG. 15C is a back perspective view of the testing device of FIG. 15A.

FIG. 16 is an exemplary system in accordance with an embodiment of thepresent disclosure.

FIG. 17 is a block diagram of an exemplary host testing device inaccordance with an embodiment of the present disclosure.

FIG. 18 is a block diagram of an exemplary microcontroller such as isdepicted in FIG. 17 .

FIG. 19 is a block diagram depicting data flow of the host testingdevice with electronic document capability.

FIG. 20 is a flowchart depicting exemplary architecture andfunctionality of the host testing device such as is depicted in FIG. 17having electronic document capability.

FIG. 21 is a block diagram of a high-voltage insulation testing systemusing a single testing device in accordance with an embodiment of thepresent disclosure.

FIG. 22 is a block diagram of a high-voltage insulation testing systemusing multiple testing devices in accordance with an embodiment of thepresent disclosure.

FIG. 23 is a block diagram of a radio-frequency analyzer testing systemusing two testers in accordance with an embodiment of the presentdisclosure.

FIG. 24 is a block diagram of a radio-frequency analyzer testing systemusing a single tester in accordance with an embodiment of the presentdisclosure.

DETAILED DESCRIPTION

The present disclosure describes testing apparatuses, systems, andmethods configured for efficiently and effectively testing electronics,components, subsystems, and/or systems. Hereinafter in the presentdisclosure the term “system” may be read to mean electronics,components, and subsystems singularly or any combination thereof undertest.

In one embodiment, a testing apparatus is a handheld device thatcomprises physical interfaces that couple the handheld device to thesystem. Additionally, the handheld device has an interactive touchscreendisplay device and/or a keyboard for receiving input from a technicianusing the handheld device.

In one embodiment, a testing system of the present disclosure comprisesthe handheld device contemplated hereinabove and a server computingdevice. In the embodiment, the handheld device comprises a wirelesscommunication module that communicates with the server computing device.The server computing device may house electronic documents indicative oftechnical information, and through the wireless communication module,the handheld device may receive electronic documents that describe thesystem-under-test. Note that the technical information may be providedto the handheld device via other means, such as, for example, via auniversal serial bus (USB) or Ethernet cable.

In one embodiment, the electronic documents retrieved may beinteractive. In such an embodiment, the handheld device may query thetechnician about the system, subsystem, component or electronic devicethat is under test and receive input from the technician. In response tothe input from the technician and measurements from the handheld device,the handheld device may display data indicative of additional queries,information, demonstrative statements, or the like that aid thetechnician in diagnosing, repairing, and/or retesting thesystem-under-test.

Additionally, in response to a test performed using the handheld device,the handheld device may retrieve technical information based upon thetest performed. In one embodiment, the test performed may result in afault indication. Based upon this fault indication, the handheld devicemay retrieve technical information, e.g., diagnostic, repair, or testinginformation, related to the particular error, that may be used by thehandheld device and/or the operator to remedy the fault.

Note that there are numerous ways the handheld device may be used totest a variety of electronics, components, subsystems, and/or systems.In one embodiment, the handheld device may be used to test cables,cables harnesses, wire harnesses, cable assemblies, wiring assemblies orwiring looms, or the like. In regard to FIG. 1 , which shall now bedescribed, the handheld device is discussed in terms of testing cableharnesses. However, as noted, the handheld device may be used to testother electronics, components, subsystems and/or systems in otherembodiments.

The following description describes handheld devices, systems, andmethods in reference to interfacing and testing cables in a CH47helicopter. This illustration is for exemplary purposes only, and thepresent disclosure is not so limited. In this regard, the handhelddevices, systems, and methods contemplated by the present disclosure maybe used to interface with a variety of electronics, components,subsystems, and/or systems.

FIG. 1 depicts an exemplary testing system 100 configured for testingand/or diagnosing a malfunction in cables in a CH47 helicopter 99 inaccordance with an embodiment of the present disclosure. Note that theuse of the CH47 helicopter is merely an example of a vehicle, device,apparatus, electrical equipment, etc. on which the testing system 100may be installed. In this regard, the testing system 100 may beinstalled on any type of electrical device that comprises cables orother electronic equipment for electrically coupling and/or controllingvarious electrical components.

In the CH47 helicopter 99 there are numerous electrical devices (notshown) coupled together via cables and other electronic components.Oftentimes, a cable or a component fails and is no longer operating oris malfunctioning. However, it is difficult to test the cables orcomponents to ascertain if the cable or component is inoperable oroperating ineffectively. In this regard, there is an overabundance ofcables connecting many electrical devices, and pinpointing a malfunctionin a single cable is difficult and cumbersome.

The testing system 100 comprises a host testing device 101 and one ormore remote testing devices 102-106. The host testing device 101controls testing of the cables or other electronic components on thevehicle by communicating with the remote testing devices 102-106. Theremote testing devices 102-106 receive and execute tests based uponcommands issued from the host testing device 101. Commands from the hosttesting device 101 comprise data indicative of the operations that areto be executed by the remote testing devices on the cables or otherelectronic components.

The system further comprises a computing device 121. Note that thecomputing device 121 can be one of any desktop computer, server, tablet,handheld device, laptop computer, or any other type of device that couldserve as a central processing apparatus.

The computing device 121 is communicatively coupled to the host testingdevice 101. In one embodiment, the computing device 121 wirelesslycommunicates with the host testing device 101. In the embodiment, thecomputing device 121 comprises a wireless transceiver (not shown) andthe host testing device 101 also comprises a wireless transceiver (notshown). The computing device 121 wirelessly communicates with the hosttesting device 101, which is described further herein. In anotherembodiment, the computing device 121 may be physically coupled to thehost testing device 101 via a cable, e.g., a universal serial bus (USB)cable.

In operation, data used in testing the system-under-test may beconfigured and/or generated by the computing device 121. As mereexamples, wiring topology and test programs may be created or generatedby a user of the computing device 121. Other types of data used intesting the system-under-test may be created and/or generatedelectronically by the computing device 121.

In one embodiment, a user of the computing device 121 creates a testprogram that comprises one or more instructions to be executed by thehost testing device 101 or the remote testing devices 102-106. Exemplaryinstructions, which are described further herein, may include aninstruction to ground a particular wire and measure a voltage related toanother wire under test. Further, an instruction may comprise acalculation, e.g., calculating resistance in the wire being tested basedupon the measurements taken, which is calculated by the host testingdevice 101 based upon the test program. Other types of instructions arepossible in other embodiments. Further, additional reference is madeherein regarding instructions contained in the test program forexecution by the host testing device 101 and/or the remote testingdevices 102-106.

The computing device 121 downloads data indicative of the test programcreated to the host testing device 101. In one embodiment, differenttest programs may be created for testing different parameters of thesystem under test. The parameters being tested may dictate the type ofinstrument to be used in the test. In this regard, the host testingdevice 101 is configured with a port, which is described further herein,for receiving a number of different adapters each having different typesof hardware for performing a particular test. Thus, multiple testprograms may be downloaded to the host testing device 101 wherein eachof the test programs downloaded is configured to run a different test oruse different hardware for running the test dictated by the testprogram.

Additionally, wiring topology of the system-under-test may be created onthe computing device 121. In this regard, a user may manually createdata, e.g., an excel spreadsheet, that describes the wiring topology ofthe system-under-test. After creation, data indicative of the wiringtopology is downloaded to the host testing device 101. The host testingdevice 101 uses the data indicative of the wiring topology in running atest program. For example, based upon the wiring topology, the hosttesting device 101 may direct one of the remote testing devices 102-106to ground a particular wire as identified in the wiring topology. Notethat an excel format is an exemplary format for the wiring topology.Other formats for the wiring topology data may be used in otherembodiments. Exemplary data files for mapping wiring topology arefurther described with reference to FIGS. 6 and 7 .

Note that a cable in the CH47 (and in other vehicles) couples one deviceto another device. That point on the cable at which a testing devicecouples to the cable is hereinafter referred to as the “coupling end.”Thus, the host testing device 101 and the remote testing devices 102-106may be connected at the coupling ends of cables (not shown) that connectthe various electrical components on the CH47 helicopter 99 for thepurpose of testing the operational status of the cables, i.e., todetermine if the cables are malfunctioning.

As indicated hereinabove, the testing system 100 may be used to testcables or other electronic components on the CH47 helicopter 99 shown inFIG. 1 . For purposes of illustration and clarity, the followingdisclosure is described with reference to the testing of cables;however, similar testing may be performed as described on otherelectronic components.

As indicated hereinabove, the host testing device 101 controls testingof the system-under-test based upon a test program. As describedhereinabove, one or more test programs are downloaded to the hosttesting device 101. When a number of test programs are resident on thehost testing device 101, the host testing device 101 may display a listof the plurality of test programs to a display device (described withreference to FIG. 4 ). A user of the host testing device 101 may thenselect one of the test programs from the listed test programs forexecution to test the system-under-test. Based upon informationcontained in the test program selected on the host testing device 101,the host testing device 101 transmits data indicative of commands and/orinstructions to the remote testing devices 102-105. Additionally, thehost testing device 101 may execute commands on the host testing device101. In response to receiving data indicative of commands and/orinstructions, the remote testing devices 102-106 execute the commandsand/or instructions.

Note that prior to selection of a test program on the host testingdevice 101, the host testing device 101 and remote testing devices102-106 are identical in hardware, software, and functionality. It isn'tuntil a test program is selected on the host testing device 101 that itbecomes the test controller of the system 100. Thus, prior to selectingthe test program on the host testing device 101, any of the testingdevices 101-106 may be used as the controller of the system 100.However, once the test program is selected on the host testing device101, it becomes the controller of the system 100. Accordingly, any ofthe testing devices 101-106 may store data indicative of test programsand store and display results from a test run by the system 100. Inlight of the foregoing, the system 100 does not require a separate orcentral controller.

With respect to the system 100, each testing device 101-106 is installedon a coupling end of a cable prior to testing. Notably, adapter cables(shown in FIGS. 2 and 3 ) are used to interface each testing device101-106 with a coupling end of a cable that typically couples to anelectrical device for power or signaling.

As was described hereinabove, each of the testing devices 101-106 isconfigured with particular hardware such that each can operate as eithera host testing device or a remote testing device, as describedhereinabove. However, with respect to FIG. 1 and for exemplary purposesthe particular configuration shows that the host testing device is hosttesting device 101, and the remote testing devices are remote testingdevices 102-106. In this regard, an installer (not shown) has selectedhost testing device 101 to be the controller by selecting a test programbeing stored on the host testing device 101, which was previouslydownloaded to the host testing device 101.

In another embodiment, upon installation the installer may choose tomake testing device 102 the host testing device, then an appropriatetest program would be loaded onto the testing device 102. When a user ofthe testing device 102 selects the test program downloaded to thetesting device 102, the testing device 102 becomes the host testingdevice. In such an embodiment, the host testing device 101 wouldtherefore operate as a remote testing device executing commands and/orinstructions received by the host testing device 101 from the testingdevice 102. Which testing device 101-106 is selected as the host testingdevice does not affect operation of the system 100.

In the embodiment being described, each of the testing devices 101-106of the system 100 interfaces with a coupling end of a wire harness thatcontains cables-under-test. A wiring harness 107 couples host testingdevice 101 to remote testing device 102, a wiring harness 108 couplesremote testing device 102 with remote testing device 103, wiring harness109 couples host testing device 101 with remote testing device 104, andwiring harness 111 couples host testing device 101 with remote testingdevice 105. Additionally, wiring harness 110 couples remote testingdevice 105 with remote testing device 104, and wiring harness 112couples remote testing device 105 with remote testing device 106.Coupling of the wiring harnesses 107-112 to the testing devices 101-106is effectuated using adapter cables (not shown but discussed furtherherein) that connect each testing device 101-106 to the respectivecables-under-test coupling-end contained within the wiring harnesses107-112.

Note that in some embodiments, each of the cables-under-test comprises aplurality of wires. During operation, the testing system 100 isconfigured to test electrical paths created by these wires that arewithin the wiring harnesses 107-112. The tests executed are configuredto test the electrical paths of the wires to determine if there are anyinoperable or malfunctioning wires in the wiring harnesses 107-112 or ifthere are any wires that have been connected incorrectly as related to awiring topology, as described hereinabove, of the testing system 100. Amore detailed description of such methods is provided more fully herein.

In one embodiment, each of the testing devices 101-106 is configured forcommunicating wirelessly. Thus, a wireless communication path existsbetween the host testing device 101 and each of the remote testingdevices 102-106. The wireless communication path allows the host testingdevice 101 to send testing commands and/or instructions to each of theremote testing devices 102-106.

Once the host test device 101 and the remote testing devices 102-106have been connected to respective coupling ends of the wire harnesses107-112, the installer activates the host testing device 101. Inresponse to activation, the host testing device 101 broadcasts a messagewirelessly to each remote testing device 102-106 requesting a response.In response to receiving the broadcast message, each remote testingdevice 102-106 transmits data indicative of a response, and at least aportion of the data transmitted includes a unique identifier. Thetransmitted data indicative of the unique identifier uniquely identifiesthe remote testing device 102-106 that transmits the data.

In one embodiment, the data indicative of the unique identifier that thehost testing device 101 receives from each remote testing device 102-106is used to identify each particular remote testing device 102-106, andthe host testing device 101 displays for viewing each identifier. Theinstaller then determines which remote testing device 102-104 isconnected to which coupling-end, i.e., the connector to which the remotetesting device 102-104 is coupled.

FIG. 2 is a block diagram of an exemplary test system 200 using fourtesting devices 280-283 in accordance with an embodiment of the presentdisclosure. Note that the handheld devices described hereinabove arehereinafter referenced as “testing devices.” Initially the testingdevices 280-283 are substantially identical in hardware, software, andfunctionality, as noted hereinabove. However, when data indicative of atest program is selected by an installer (not shown), the handhelddevice for which the test program is selected becomes a host testingdevice.

In the exemplary testing system 200 depicted in FIG. 2 , data indicativeof a test program has been loaded onto testing device 280 therebyidentifying it as the host testing device 280. The remaining threetesting devices 281-283, referred to as remote testing devices 281-283,do not contain the data indicative of the test program; however, eachdoes execute commands and/or instructions based upon data received fromthe host testing device 280, which is contained in the test program.

FIG. 2 shows an exemplary setup of the testing devices 280-283. Notably,the cables-under-test include cable 206, cable 208, and cable 209. Inthe description hereafter, reference is made to adapter cables. Inaccordance with the present disclosure, the term “adapter cable”includes two connectors and a cable. The cable is coupled at a first endto a testing device connector and coupled at a second end to a cableconnector. The testing device connector connects to a testing device,e.g., a host testing device or a remote testing device. The cableconnector connects to a cable-under test. In one embodiment, the testingdevice comprises a 128-pin connector that couples to electronics in thetesting device, and the testing device connector is a complementary128-pin connector that mates with the connector on the testing device.In another embodiment, the testing device may comprise an electronicsdevice that couples to the testing device via a series of electricalcontacts. In such an embodiment, the adapter cable would couple to theelectronics device. Further, the electronics device may enableadditional functionality, including hardware and logic that allows thetesting device to perform a variety of different tests.

In regards to FIG. 2 , the host testing device 280 is connected throughan adapter cable 205 to the cable-under-test 206. The cable-under-test206 is adapted to the remote testing devices 281 and 283.

The adapter cable 205 adapts a connector 240 on the host testing device101 to the connectors 241, 242 that are coupled to the cable-under-test206. Likewise, adapter cable 210 connects the cable-under-test 206 withthe remote testing device 281 through a connector 213 and a connector250, and adapter cable 219 connects the cable-under-test 206 with theremote testing device 283 through a connector 217 and a connector 252.

Note that the system 200 is further configured to test cables that arenot necessarily directly electrically coupled to the host testing device101. In the exemplary system 200, the cable 208 and the cable 209 arenot directly electrically coupled to the host testing device 101. Inthis regard, adapter cable 211 connects remote testing device 282 withthe cable-under-test 208 through a connector 214 and a connector 251,and adapter cable 212 connects remote testing device 283 with thecable-under-test 208 through a connector 215 and the connector 252.Further, cable-under-test 209 connects with remote testing device 283via adapter cables 218 and 219 through connectors 216 and 217 and theconnector 252. Note that cable-under-test 209 originates and terminateswith remote testing device 283. In such an embodiment, the remotetesting device 283 by itself may be used to test the cable-under-test209 at the direction of the host testing device 280.

As described in the present embodiment, the testing devices 280-283 maycomprise 128-pin connectors that interface each testing device 280-283with respective adapter cables 205, 210, 211, and 212. Note that as willbe shown further herein, the testing devices 280-283 may comprise anadapter module (not shown) that couples to the testing devices 280-283.In such an embodiment, the adapter module is removable. Thus, instead ofproviding 128-pin connectors for interfacing with the cables 206-209, inone embodiment, the testing device may comprise a plurality of springcontacts, and the adapter module may comprise a plurality ofcorresponding mating target areas that establish an electricalconnection when in contact with the spring contacts between the adaptormodule and the testing device. In this regard, the spring contactsprovide connections with the adapter of the system 200. The adaptercable utilizing spring contacts may connect to a plurality of differentadaptors having different coupler ends. Further, the spring contactadapter provides a more reliable connection than the 128-pin typeadapter module that it can replace. In such an embodiment, the springcontact adapter module may comprise a printed-circuit-board with targetmetalized areas for connection to the spring contacts.

The testing architecture and methods of testing the cables-under-testare described more fully herein. Notably, however, the host testingdevice 280 directs the remote testing devices 281-283 to performoperations during execution of a test program. The host testing device280 takes measurements based upon the operations executed by the remotetesting devices 281-283 to ensure that the cables-under-test 206-209 areconnected correctly, operating, and operating properly. Additionally,the remote testing devices 281-283 may also take measurements where theremote testing devices 281-283 are not directly connected to the hosttesting device 280. In such a scenario, the remote testing devices281-283 may take measurements and transmit data indicative of themeasurements to the host testing device 280.

In response to measurements taken and measurements received from remotetesting devices 281-283, the host testing device 280 performscalculations and determines pass/fail results. The host testing device280 stores data indicative of measurements taken and received innonvolatile memory for the installer (not shown) to view.

FIG. 3 depicts a system 300 that is configured for testing a cable 306wherein the system 300 only has a single testing device 301. Thus, inone embodiment a testing device 301 in accordance with an embodiment ofthe present disclosure has standalone test capabilities. In such anembodiment, an adapter cable 303 couples a connector 302 to theconnectors 304, 305 of the cable 306. Through a series of operations andmeasurement, the testing device 301 determines that the cable 306 isconnected properly and operating properly. The architecture and methodfor testing the cable 306 is described more fully herein.

FIG. 4 depicts an exemplary host testing device 101 such as is depictedin FIG. 1 . The exemplary host testing device 101 generally comprisesprocessor 400, output interface 408, input interface 407, a wirelesslocal area network (WLAN) Wi-Fi transceiver 413, transceiver 409, aBluetooth® transceiver, and a cable interface connector 410. Each ofthese components communicates over local interface 406, which caninclude one or more buses.

The host testing device 101 further comprises host control logic 402,configuration data 403, test data 404, and cable data 405. Control logic402 can be software, hardware, or a combination thereof. In theexemplary host testing device 101 shown in FIG. 4 , host control logic402 is software stored in memory 401. Memory 401 may be of any type ofmemory known in the art, including, but not limited to random accessmemory (RAM), read-only memory (ROM), flash memory, and the like.

As noted hereinabove, control logic 402, configuration data 403, testdata 404, and cable data 405 are shown in FIG. 4 as stored in memory401. When stored in memory 401, control logic 402, configuration data403, test data 404, and cable data 405 can be stored and transported onany computer-readable medium for use by or in connection with aninstruction execution system, apparatus, or device, such as acomputer-based system, processor-containing system, or other system thatcan fetch the instructions from the instruction execution system,apparatus, or device and execute the instructions.

In the context of the present disclosure, a “computer-readable medium”can be any means that can contain, store, communicate, propagate, ortransport the program for use by or in connection with the instructionexecution system, apparatus, or device. The computer readable medium canbe, for example but not limited to, an electronic, magnetic, optical,electromagnetic, infrared, or semiconductor system, apparatus, device,or propagation medium.

Processor 400 may be a digital processor or other type of circuitryconfigured to run the control logic 402 by processing and executing theinstructions of the control logic 402. Further, the processor 400communicates with and drives the other elements within the host testingdevice 101 via the local interface 406.

In addition, the transceiver 409 may be, for example, a low-poweredradio device, e.g., a radio semiconductor, radio frequency antenna (RFantenna) or other type of communication device, which communicativelycouples the host testing device 101 with the remote testing devices102-106 (FIG. 1 ). In one embodiment, the transceiver 409 is a wirelesstransceiver that is configured to transmit and receive messageswirelessly from the remote testing devices 102-106. In this regard, thecontrol logic 402 may communicate bi-directionally via the transceiverwith each remote testing device 102-106.

The Wi-Fi transceiver 413 is any type of transceiver that allows thehost test device 101 to communicate with a computer network (not shown).As an example, the Wi-Fi transceiver 413 allows the host test device 101to transmit and receive data via the Internet.

The host testing device 101 further comprises the Bluetooth® transceiver441. The Bluetooth® transceiver 441 enables the host testing device 101to communicate short-range with cellular phones, computers, or otherelectronic devices.

The output interface 408 is any type of device for providing informationto a user, e.g., an installer of the system 100. In this regard, theoutput interface may be, for example, a backlit liquid crystal display(LCD) screen (not shown), which is touch-sensitive for operation with astylus (not shown). Other types of output interfaces 308 may be, forexample, an audio device that provides instructions to the installeraudibly, light emitting diodes (LED) that show status of the hosttesting device, or any other type of output interface that providessensory information to the installer. While some examples have beengiven, other types of output interfaces may be used in other embodimentsof the present disclosure.

The input interface 407 is any device that enables the installer toinput data into the host testing device 101. In one embodiment, theinput interface 407 is a touchscreen that allows the user to provideinformation to the host testing device 101 by selecting areas on thetouch screen. In another embodiment, the input interface may be, forexample, a keyboard or a microphone. In this regard, the installer mayuse the keyboard to type data into the host testing devices. While someexamples have been given, other types of input interfaces may be used inother embodiments of the present disclosure.

Note that the output interface 408 and input interface 407 may becombined into a touchscreen device (not shown). In such an embodiment,an installer may use the touchscreen to select a test to be run andreview test results. Additionally, the user may view and set testerconfigurations, e.g., radio settings, display brightness, monitorbattery charge, status, etc. Further, as will be described withreference to FIG. 16 , the installer may also connect to a computer overthe Internet or other network to upload and download data, such as testprograms, test results, or processor memory contents. Additionally, theinstaller may view images, diagrams, documentation, instructions orother data that is either resident in memory 401 or is downloaded from acomputer via a network, as described with reference to FIG. 16 .

The host testing device 101 further comprises an interface connector410. The interface connector 410 is any type of connector that couplesthe host testing device 101 to an electronic device, such as, forexample a cable. In one embodiment, the interface connector 410 may be a128-pin connector that couples to, for example, an adapter cable asdescribed with reference to FIG. 2 . In another embodiment, theinterface connector may be a set of spring contacts that allows anelectronic device or smart adapter to be interfaced with the hosttesting device 101.

Configuration data 403 is any type of data that defines the operation ortesting of the system 100. In this regard, the configuration data 403may comprise data indicative of test limits and harness wireconnectivity. Notably, a test executed by the testing device 101 maydetermine if a wire is connected correctly and not connected to anyother path. Thus, the configuration data 403 may comprise dataindicative of continuity limits, e.g., 1 Ohm, and isolation limits,e.g., 100 KOhm. In a particular test commanded by the host testingdevice 101, resistance may be measured and compared with the continuitylimit. If the measurement is less than the continuity limit, then thecable-under-test for the particular connection is operating properly.Other configuration data 403 may be data indicative of isolation limits.An isolation limit is the resistance between one wire and all otherwires. In such an example, the host testing device 101, measures theresistance between the wire being tested and all the other wires in acable harness. If the resistance measured is greater than the isolationlimit, there is no connection. The data indicative of the isolationlimit may be for example an isolation limit of 100 kΩ. Other types ofconfiguration data 403 may be a cable part number identifying thecable-under-test or a test identifier that identifies the tests beingrun on the cable-under-test.

Test data 404 is any data indicative of test results performed on acomponent being tested by the host testing device 101. As an example,the test data 404 may comprise data indicative of the results of thetest of the cables-under test, as described with reference to FIG. 2 .In this regard, the test data 404 may comprise data indicating that aparticular wire was tested and the outcome of the test correlated withthe wire tested.

Cable data 405 is data that describes the testing configuration of thecables-under-test. Exemplary cable data 405 is shown and depicted inFIGS. 6 and 7 . Notably, in one embodiment, the cable data 405 isgenerated on a computing device 121 (FIG. 1 ) in a computer and humanreadable format, such as, for example Excel x. The cable data 405 isdownloaded to the host testing device 101 through a computing deviceinterface 411, which can be, for example, a universal serial bus (USB)port, and Ethernet connection, or any type of interface that allowsinformation to be transferred from the computing device 121 to the hosttesting device 101.

Further, the memory 401 may store data indicative of test programs450-452. As identified hereinabove, test programs are downloaded to thehost testing device 101 from a computing device 121 (FIG. 1 ). Thesetest programs 450-452 comprise data indicative of commands and/orinstructions to be carried out by the host testing device 101 and theremote testing devices 102-106 (FIG. 1 ) during testing. In oneembodiment, the host control logic 402 may display a listing of the testprograms 450-452 to the output interface 408. An installer (not shown)can select from the list which test program to execute, and onceselected, the host testing device 101 is the controller of the test.

Note that the host testing device 101 further comprises a battery 412.The battery 412 provides power to the host testing device 101. Thebattery 412 is an exemplary power source. In other embodiments, the hosttesting device 101 may be powered by a universal serial bus (USB)connected to a computer or an alternating current (A/C) adapter.Furthermore, the battery 412 may be charged by the USB or the A/Cadapter (not shown).

The host testing device 101 depicted in FIG. 4 may be used as a singletesting device in the configuration depicted in FIG. 3 (testing device301). In such an embodiment, the host control logic 402 comprises alllogic necessary to test the cable 306 (FIG. 3 ). As noted hereinabove,the host control logic 402 may comprise hardware, software, and/orfirmware for controlling the testing of the cable 306.

FIG. 5 depicts an exemplary remote testing device 101 such as isdepicted in FIG. 1 . The exemplary remote testing device 102 generallycomprises processor 500, output interface 508, input interface 507,wireless local area network (WLAN) Wi-Fi transceiver 513, transceiver509, a Bluetooth® transceiver, and a cable interface connector 519. Eachof these components communicates over local interface 506, which caninclude one or more buses.

The remote testing device 102 further comprises remote control logic502, although the remote testing device 102 may be operated as a hostdevice, if a test program is transmitted to the remote testing device102 as opposed to any other testing device. Control logic 502 can besoftware, hardware, or a combination thereof. In the exemplary remotetesting device 102 shown in FIG. 5 , control logic 502 is softwarestored in memory 501. Memory 501 may be of any type of memory known inthe art, including, but not limited to random access memory (RAM),read-only memory (ROM), flash memory, and the like.

As noted hereinabove, control logic 502 is shown in FIG. 5 as softwarestored in memory 501. When stored in memory 501, control logic 502 canbe stored and transported on any computer-readable medium for use by orin connection with an instruction execution system, apparatus, ordevice, such as a computer-based system, processor-containing system, orother system that can fetch the instructions from the instructionexecution system, apparatus, or device and execute the instructions.

In the context of the present disclosure, a “computer-readable medium”can be any means that can contain, store, communicate, propagate, ortransport the program for use by or in connection with the instructionexecution system, apparatus, or device. The computer readable medium canbe, for example but not limited to, an electronic, magnetic, optical,electromagnetic, infrared, or semiconductor system, apparatus, device,or propagation medium.

Processor 500 may be a digital processor or other type of circuitryconfigured to run the control logic 502 by processing and executing theinstructions of the control logic 502. Further, the processor 500communicates with and drives the other elements within the remotetesting device 102 via the local interface 506.

In addition, the transceiver 509 may be, for example, a low-poweredradio device, e.g., a radio semiconductor, radio frequency antenna (RFantenna) or other type of communication device, which communicativelycouples the remote testing device 102 with the host testing device 101(FIG. 4 ) while executing a harness test. In one embodiment, thetransceiver 509 is a wireless transceiver that is configured to transmitand receive messages wirelessly from the host testing device 101. Inthis regard, the control logic 502 may communicate bi-directionally viathe transceiver with the remote testing devices 102-106 or the hosttesting device 101. The Wi-Fi transceiver 513 is any type of transceiverthat allows the host test device 101 to communicate with a computernetwork. For example, the transceiver 413 enables the remote testingdevice 102 to communicate with the Internet.

The remote testing device 102 further comprises the Bluetooth®transceiver 541. The Bluetooth® transceiver 541 enables the remotetesting device 102 to communicate short-range with cellular phones,computers, or other electronic devices.

The output interface 508 is any type of device for providing informationto a user, e.g., an installer of the system 100. In this regard, theoutput interface may be, for example, a backlit liquid crystal display(LCD) screen (not shown), which is touch-sensitive for operation with astylus (not shown). Other types of output interfaces 508 may be, forexample, an audio device that provides instructions to the installeraudibly, light emitting diodes (LED) that show status of the hosttesting device, or any other type of output interface that providessensory information to the installer. While some examples have beengiven, other types of output interfaces may be used in other embodimentsof the present disclosure.

The input interface 507 is any device that enables the installer toinput data into the remote testing device 102. In one embodiment, theinput interface 507 is a touchscreen that allows the user to provideinformation to the remote testing device 101 by selecting areas on thetouch screen. In another embodiment, the input interface may be, forexample, a keyboard or a microphone. In this regard, the installer mayuse the keyboard to type data into the host testing devices. While someexamples have been given, other types of input interfaces may be used inother embodiments of the present disclosure.

The remote testing device 102 comprises the interface connector 510. Inone embodiment, the interface connector 510 may be, for example, a128-pin connector that may be used to couple the remote testing device102 with a wire harness. However, the interface connector 510 may alsocomprise a smart adapter with spring contacts, which is describedherein.

Note that configuration data, test data, cable data, and test programsare not shown on the remote testing device 102. In this regard, only thetesting device to which the test programs 450-452 (FIG. 4 ) istransmitted will be the host testing device, and such data is notresident on the remote testing device 102. Note, however, that if a testprogram 450-452 is loaded onto the remote testing device 102, andselected by an installer, it can behave as the host. In the exampleprovided, it is assumed that remote testing device 102 is a remotetesting device that receives testing commands and/or instructions fromthe host testing device 101.

Note that the remote testing device 102 further comprises a battery 512.The battery 512 provides power to the remote testing device 102. Thebattery 512 is an exemplary power source. In other embodiments, theremote testing device 101 may be powered by a universal serial bus (USB)connected to a computer or an alternating current (A/C) adapter.Furthermore, the battery 512 may be charged by the USB or the A/Cadapter (not shown).

FIG. 6 depicts an excel spreadsheet 600 that is created by an installerto define the cable-under-test and the topology of connections. Thespreadsheet 600 defines connections where there is but a single testingdevice such as is depicted in FIG. 3 . In this regard, the spreadsheet600 defines the cable data 405 (FIG. 4 ) that is downloaded to thetesting device 301 (FIG. 3 ). Note that the spreadsheet 600 comprisescable data 405 for a system 300 (FIG. 3 ) for a single testerconfiguration.

The spreadsheet comprises a column 601 of wire identifiers. These wireidentifiers define the wires within the cable-under-test. In thisregard, there are wire identifiers W1 through W11 indicating there areeleven (11) wires in the cable-under-test.

Columns 602 and 603 identify the testing device (in the example providedis “T1”) and pins on the testing device 301 (FIG. 3 ) of the connector302 (FIG. 3 ). In regards to row “W1,” the identifier “T1” identifiesthe testing device 301, and the number following, i.e., “T1-1,”identifies the pin of the testing device, i.e., pin 1. Likewise, incolumn 603 on row “W1,” the identifier “T1” identifies the testingdevice 301, and the number following, i.e., “T1-2,” identifies the pinof the testing device, i.e., pin 2. Thus, a first end of wire 1 isconnected to pin 1 of the testing device 301 and the terminating end ofwire 1 is connected to pin 2 of the testing device 301.

Columns 604 and 605 identify pins on the connectors 304 and 305 thatconnect the adapter cables to the coupling-ends of the cable-under-test.In this regard, the “H3-1” identifies a specific pin on connector 304,and the “J32-2” identifies a specific pin on connector 305.

Accordingly, analyzing “W1” across the row, the data entered defines anentire wire connection. In this regard, “W1” of the cable-under-test isconnected to H3-1 of the connector 304 and the other end of the wire isconnected to J32-2 of connector 305. Additionally, through the adaptercable 303, pin H3-1 is connected to T1-1, and pin J32-2 is connected topin T1-2. Thus, a connected electrical loop is defined in thespreadsheet 600. The remaining electrical connections are furtherdefined in the following rows.

In addition to the wiring data as described, the configuration data 403(FIG. 4 ) may also be included in the spreadsheet 600. As an example, atest identifier, continuity limits, isolation limits, and/or a partnumber of the cable-under-test. Further, while there may be a globalcontinuity test limit defined in the spreadsheet, there may also beindividual circuit continuity limits included per row in the “ContinuityResistance” column 606.

As described hereinabove, the installer manually generates thespreadsheet 600 on a computing device 121 (FIG. 1 ) defining theconnections for the system comprising cables-under-test. Data indicativeof the spreadsheet 600 is then transmitted to the testing device, e.g.,the host testing device 101, through the computing device interface 411(FIG. 4 ) from the computing device 121.

As indicated hereinabove with respect to FIGS. 3 and 4 , the testingdevice 101 in FIG. 4 , may be used as a single testing device in theconfiguration depicted in FIG. 3 . The data indicated in the spreadsheet600 comprises data describing the wiring topology for a single testingdevice configuration, as indicated hereinabove. In operation, thecontrol logic 402 (FIG. 4 ) performs all operations for testing a cable.

In this regard, once the wiring topology data indicated in thespreadsheet 600 is downloaded to a testing device, e.g., the hosttesting device 101 (FIG. 4 ), and stored as cable data 405, the controllogic 402 uses the data to execute one of the test programs 450-452selected by the installer. As an example, if the test program 450-452comprises a command that instructs the control logic 402 to ground aparticular wire, the control logic 402 parses the control data 405 toidentify the connector and pin associated with the particular wire. Tofurther the example, if the command instructs the control logic 402 toground the wire identified as W1, the control logic 402 locates W1 inthe cable data 405. The control logic 402 then cross-references the W1identifier as shown in column 601 and further identifies connector/pinH3-1 and connector pin J32-2. In response, the control logic 402 groundspin 1 of connector H3 and pin 2 of connector J32 to perform the testindicated by the test program 450-452. FIG. 7 depicts an excelspreadsheet 700 that is created by an installer to define thecables-under-test and the topology of connections. The spreadsheet 700depicted in FIG. 7 differs from spreadsheet 600 in that there are threetesting devices designated as “T1,” “T2,” and “T3” as opposed to only asingle testing device. Note that hereinabove the testing devices arereferred to as host testing devices or remote testing devices. Forsimplicity of explanation of the wire topology, the terms “testingdevice” and “T1,” T2,” and “T3” are used in the following description.However, note that one of the three testing devices is a host testingdevice, and the remaining two testing devices are remote testingdevices.

The spreadsheet 700 defines the cable data 405 (FIG. 4 ) that isdownloaded to the host testing device 101 (FIG. 1 ) from the computingdevice 121. Note that the spreadsheet 700 comprises cable data 405 for asystem having a multiple testing device configuration as opposed to asingle tester configuration as described with reference to FIG. 6 .

The spreadsheet comprises a column 701 of wire identifiers. These wireidentifiers define the wires within the cable-under-test. In thisregard, there are wire identifiers W1 through W24 indicating there aretwenty-four (24) wires in the cable-under-test.

Columns 702 and 703 identify pins on the connector of the testingdevices “T1,” “T2,” and “T3.” Note that the testing devices areindicated via identifiers “T1,” “T2,” and “T3,” and the numberfollowing, e.g., T1-1, identifies the pin of the testing device, i.e.,pin 1. Furthermore, in the topology defined in spreadsheet 700 there arethree testing devices as indicated by the “T1,” “T2,” and “T3”identifiers.

Columns 704 and 705 identify pins on the adapter connectors. In thisregard, the “H3-1” identifies a specific pin on an adapter connector(“H3”) connected to “T1,” and the “J32-2” identifies pin 2 on theadapter connector (“J32”) connected to “T2” at the coupler ends.

Accordingly, analyzing “W1” across the row, the data entered defines anentire wire connection. Wire one originates and is connected at “T1-1”of the testing device connecter, which is then connected to “H3-1” ofthe adapter connector. Wire one is then connected to “J32-2,” which isconnected to “T2-1.” Thus, a connected electrical loop is defined in thespreadsheet 700 for a wire W1 that is connected to tester “T1” andtester “T2.” The remaining electrical connections are further defined inthe following rows.

As described hereinabove, the installer manually generates the data 700on the computing device 121 (FIG. 1 ) defining the connections for thesystem comprising cables-under-test. Data indicative of the spreadsheet700 is transmitted to the testing device, e.g., the host testing device101, through the computing device interface 411 (FIG. 4 ) from thecomputing device 121. The data 700 is received from the computing device121 and stored as cable data 405 (FIG. 4 ).

FIG. 2 depicts a configuration for which data 700 may be used in testingthe cable-under-test. However, in the data 700 there are only threetesting devices indicated as opposed to three testing devices indicatedin FIG. 2 . For exemplary purposes, use of the data 700 in performingtests on the configuration in FIG. 2 is described.

As indicated hereinabove with respect to FIGS. 2 and 4 , the testingdevice 101 in FIG. 4 , may be used with multiple remote testing device281-283. The data 700 comprises data describing the wiring topology fora configuration wherein there are multiple remote testing devices, T1,T2, and T3. For purposes of illustration, T1 will refer to the hosttesting device 280 and T2 and T3 will refer to remote testing device 282NS 283.

In this regard, once the wiring topology data 700 is downloaded to atesting device, e.g., the host testing device 101 (FIG. 4 ), and storedas cable data 405, the control logic 402 uses the data to execute one ofthe test programs 450-452 selected by the installer. As an example, ifthe test program 450-452 comprises a command that instructs the controllogic 402 to ground a particular wire, the control logic 402 parses thecontrol data 405 to identify the connector and pin associated with theparticular wire. To further the example, if the command instructs thecontrol logic 402 to ground the wire identified as W1, the control logic402 locates W1 in the cable data 405. The control logic 402 thencross-references the W1 identifier as shown in column 701 and furtheridentifies the remote testing device T1, i.e., host testing device 280(FIG. 2 ), with the connector/pin H3-1 and remote testing device T2,i.e., remote testing device 282, with the connector pin J32-2. Inresponse, the control logic 402 grounds pin 1 of connector H3 and pin 2of connector J32 to perform the test indicated by the test program450-452.

Note that there are multiple testing devices and multiple cables undertest as described with reference to FIG. 2 and FIG. 7 . In oneembodiment, the host control logic 402 may test a single cable in theconfiguration shown in FIG. 2 between two of the testing devices. Thismay be referred to a “partial test.” As an example, the installer maydesire to test only cable 206 that connects the host testing device 280to the remote testing device 283.

During a partial test, the control logic 402 displays to the installer alist of testing devices in the configuration. The installer selects thetesting devices and associated cable from the list. As an example, theinstaller may select cable 206 that is coupled between testing devices280 and 283 (FIG. 2 ). The control logic 402 uses the control data 405to determine which connectors and pins are to be used in the test basedupon the selection by the installer.

The testing methods are now described for determining if a wire isconnected, connected properly, and is operating accordingly.

FIG. 8 is a block diagram depicting an exemplary circuit that may beused to test an electrical component of the system 100 (FIG. 1 ). FIG. 8depicts the host testing device 101 and the remote testing device 102.Connected between the Host testing device 101 and remote testing device102 is a cable-under-test 801 that comprises wires 1 through n.

As will be discussed further herein, in one embodiment, the wires 1through n may be grouped together according to the pins to which theyare connected. Specifically, if a plurality of the wires are coupled toa common pin then the plurality is grouped together. A plurality ofwires grouped together based upon a common connection is referred to asa “net.”

The host testing device 101 comprises the control logic 402. Further,the host testing device 101 comprises switching, continuity, andisolation measurement circuitry 800, which is described in greaterdetail hereafter.

The remote testing device 102 comprises the control logic 502.Additionally, remote testing device 102 comprises switching, continuity,and isolation measurement circuitry 890.

A wireless link 805 communicatively couples the host testing device 101to the remote testing device 102, as is described with reference toFIGS. 4 and 5 . Note that during testing, the host testing device 101transmits test commands to the control logic 502 of the remote testingdevice 102 via the wireless link 805. In addition, the remote testingdevice 102 may transmit requested data to the host testing device 101via the wireless link 805.

Prior to testing, the cable data 405 (FIG. 4 ) is loaded onto the hosttesting device 101, as described hereinabove with reference to FIGS. 6and 7 . Note that the cable data 405 reflects the wiring topology thatdefines which wires are connected to which pins on the connectors of thehost testing device 101 and the remote testing device 102.

In the embodiment depicted in FIG. 8 , a test program 450-452 (FIG. 4 )has been loaded onto the host testing device 101 and selected by aninstaller. Once selected, the host testing device 101 becomes thecontroller of any tests that may be performed on the wires 1 through nin the configuration depicted. In this regard, tests on the wires 1through n will initiate from the host testing device 101, including testcommands being sent to the remote testing device 102.

The control logic 402 in conjunction with the control logic 502 testscontinuity and isolation resistance for each wire. In one embodiment,the control logic 402 performs such test one wire at a time; however inother embodiments the wires may be tested in parallel, i.e., more thanone wire is tested at the same time. During the testing of a particularwire, all other wires within the cable-under-test 801 are connected toground. In this regard, prior to testing, the control logic 402transmits a message to the control logic 502 that commands the controllogic 502 to connect all wires except for the wire being test to ground.In response, the control logic 502 instructs the circuitry 890 toconnect all wires to ground except the wire being tested.

The control logic 402 then instructs the circuitry 800 to performoperations and to take measurements related to the wires 1 through n.Once measurements are taken, the control logic 402 performs calculationsthat determine whether a particular wire 1 through n is workingproperly. For example, the control logic 402 may measure a voltage andcalculate a resistance. The control logic 402 may compare the resistancecalculated to a limit, e.g., the isolation or continuity limitidentified in the data 700 (FIG. 7 ) to determine if the wire is workingproperly.

As indicated hereinabove, the wires 1 through n may comprise a net.Notably, one of the wires depicted may comprise a plurality of wiresthat are connected to a common pin. When a net is being tested, asopposed to a single wire, the control logic 402 may transmit a commandto the control logic 502 to ground all wires contained within a net. Inresponse, the control logic 502 instructs the circuitry 890 to groundall wires within a net. Note that in one embodiment, the system 100(FIG. 1 ) may comprise remote testing devices, e.g., remote testingdevice 104 (FIG. 1 ) and remote testing device 105 (FIG. 1 ) that arecoupled via a cable 110 that is not connected to the host testing device101 (FIG. 1 ). In such a scenario, the host testing device 101 transmitsa command to one of the testing devices, e.g., remotes testing device105, to connect all wires not be tested to ground. In addition, the hosttesting device 101 transmits a command to the other remote testingdevice, e.g., remote testing device 104, to take measurements relatingto the wire being tested and transmit the measurements to the hosttesting device 101. Once the test is completed, the remote testingdevice 104 transmits measurements taken to the host testing device 101,and the control logic 402 determines whether there is a fault in thecable tested.

Note that while a test is being performed, the host testing device 101and/or the remote testing device 102 may activate their respectiveoutput interfaces 408 and 508 to alert the installer that a test isunderway. In this regard, the output interface activated may include alight emitting diode (LED) that blinks a particular color, an LCD thatdisplays text indicating a test is being performed, e.g., “TESTING,” orany other type of output interface that could notify the installer thata test is underway.

FIG. 9 depicts exemplary circuitry 800 for the host testing device 101for performing continuity and isolation testing on a cable-under-test.The circuitry 800 comprises a microprocessor 900, a series ofmultiplexers 905, and a series of transistors 901 ₁-901 _(n).

In one embodiment, during operation, the host testing device 101transmits a wireless signal to the remote testing device 102 (FIG. 8 )that comprises data indicative of a command to connect to ground allwires not being tested. During the test, the control logic 402 instructsthe microprocessor to perform certain functions. In one embodiment, themicroprocessor 900 instructs a multiplexer 905 to select the wire beingtested, e.g., one of the wires 1 through n. Note that the control logic402 (FIG. 8 ) that is controlling the testing may use the cable data 405to determine which wires is to be selected. Once selected, i.e., theswitch corresponding to the wire being tested is closed, themicroprocessor 900 connects the remaining wires to ground via thetransistors 901 ₁-901 _(n). The microprocessor 900 calculates theresistance (not shown) in the wire being tested via a voltage dividercreated when the switch is closed with V_(ref) 906, R_(test) 907, andthe voltage differential of the wire being tested to ground. Themicroprocessor 900 then converts the voltage differential of the wirebeing test to ground to a digital value and calculates the resistance inthe wire being tested, which is described further with reference to FIG.10 .

In this regard, FIG. 10 depicts a block diagram of exemplary circuitry800 and 890 implemented in the host testing device 101 and the remotetesting device 102, respectively. Further, with reference to FIG. 10 acontinuity test shall be described.

The remote testing device 102 comprises the switches 802 ₁-802 _(n)corresponding to the wires 1 through n, which may be implemented with aseries of transistors. Further, as described hereinabove with referenceto FIG. 9 , the host testing device 101 comprises the series ofmultiplexers 905, the series of transistors 901 ₁ through 901 _(n)corresponding to the wires 1 through n, and an analog-to-digitalconverter (ADC) 1001.

During continuity testing, each of the wires 1 through n is tested. Inone embodiment, resistance in the wire being tested is calculated andcompared with a continuity test limit, which is identified in the cabledata 405 (FIG. 4 ). If the resistance in the wire is greater than thetest limit, this indicates a continuity fault, and the test on the wirefails.

In performing the continuity test, the host testing device 101 connectsall wires to ground 1003 via the transistors 901 ₁ through 901 _(n).Further, the host testing device 101 transmits a command to the remotetesting device 102 to connect all wires to ground. In response, theremote testing device 102 connects all wires to ground via transistors802 ₁ through 802 _(n). The host testing device 101 selects the wire tobe tested by selecting and configuring one of the multiplexers 905.

The host testing device 101 then measures the resistance R_(wire) ineach of the wires 1 through n. In this regard, the host testing device101 selects each wire using the series of multiplexers 905, for examplefirst selecting wire 1, by connecting the wire to the reference voltageV_(ref) 906 through resistor R_(test) 907. A current I_(test) then flowsfrom V_(ref) through the wire being tested, e.g., wire 1, and returnsthrough wires 1 through n to ground 1003. The ADC 1001 converts thevoltage differential V_(test) between the wire being tested, and groundand the control logic 402 (FIG. 4 ) calculates R_(wire) via thefollowing formula:

R _(wire) V= _(ref)(R _(test)/(V _(ref) −V _(test)))−(R _(test) +R_(mux) +R _(nfet))

The control logic 402 compares the calculated R_(wire) with the testlimit for the continuity test, e.g., 1 Ohm. If it R_(wire) is greaterthan the test limit, the wire has a continuity fault. The installer isthen alerted of the fault via the output interface 408 of the failure onthe particular wire tested.

Note that each of the wires 1 through n are tested for continuity. Inthis regard, the method described above is performed for each of thewires 1 through n, and a result of the test is displayed to theinstaller via the output interface 408 (FIG. 4 ), and data indicative ofthe result is stored as test data 404 (FIG. 4 ).

FIG. 11 depicts a block diagram of hardware implemented in the hosttesting device 101 and the remote testing device 102. Further, withreference to FIG. 11 an isolation resistance test shall be described.

During isolation testing, each of the wires 1 through n is tested. Inone embodiment, resistance between the wire being tested and theremaining wires is compared with an isolation test limit. If theresistance is less than isolation the test limit, this indicates anisolation fault, and the test on the wire fails.

In performing the isolation test, the host testing device 101 connectsall wires to ground 1003 via the transistors 901 ₁ through 901 _(n).Further, the host testing device 101 transmits a command to the remotetesting device 102 to disconnect the wire to be tested. Thus, as anexample in FIG. 11 , the switch 802 ₁ is opened in response to thecommand from the host testing device 101. Notably, each of the wires 1through n is tested consecutively for isolation resistance.

The host testing device 101 then measures the resistance R_(ISO1) ineach of the wires 1 through n. In this regard, the host testing device101 selects each wire using the series of multiplexers 905, for examplefirst selecting wire 1, by connecting the wire to the reference voltageV_(ref) 906 through resistor R_(test) 907. The ADC 1001 converts thevoltage differential V_(test) between the wire being tested and ground,and the control logic 402 (FIG. 4 ) calculates R_(ISO1) via thefollowing formula:

R _(ISO1)=(V _(test) *R _(test))/(V _(ref) −V _(test))

The control logic 402 compares the calculated R_(ISO1) with the testlimit for the isolation test, e.g., 100 kΩ If it R_(ISO1) is less thanthe test limit, the wire has an isolation fault. The installer is thenalerted of the fault via the output interface 408 of the failure on theparticular wire tested.

Note that each of the wires 1 through n are tested for isolation. Inthis regard, the method described above is performed for each of thewires 1 through n, and a result of the test is displayed to theinstaller via the output interface 408 (FIG. 4 ), and data indicative ofthe result is stored as test data 404 (FIG. 4 ).

FIG. 12 depicts a test schematic for use in the architecture andfunctionality of the system 100 (FIG. 1 ). In this regard, FIG. 12 issimilar to FIG. 10 regarding components used on the host testing device101 and the remote testing device 102.

Notably, FIG. 12 further depicts a plurality of wires labeled “W1”through “Wn.” Where there is a plurality of wires, e.g., W1 through W3that are connected together, this is referred to as a “net.” In thisregard, the wires W1 through W3 share a common connection.

Note that the testing described herein does not require the use ofadditional ground cables. Instead, the cable data 405 defines wires thatare used as a ground path return during test signal measurement.Further, the cable data 405 comprises data that allows for calculatingresistances of wires used as ground return wires for test measurements.

Note that in FIGS. 8-12 an embodiment of the system is shown using botha host testing device and a remote testing device. However, as indicatedhereinabove with reference to FIG. 3 , a testing device in accordancewith an embodiment of the present disclosure may operate as a soletesting device, i.e., in the example in FIG. 3 a single testing device301 (FIG. 3 ) is used to test the cable 306 (FIG. 3 ). In an embodimentwherein a single testing device is used, the testing device comprisesthe circuitry 800 and 890, and the control logic of the testing devicegoverns the execution of a test program using the cable data 405 (FIG. 4) of data, e.g., data 600 (FIG. 6 ) for a single tester.

FIG. 13A provides an exemplary fault algorithm describing the faults asused in testing of the cables-under-test. FIG. 13A depicts anexplanatory fault flow wherein pins are intended to be connected and anexplanatory fault flow wherein nets are not intended to be connected.Both of which are tested as described hereinafter with reference to FIG.13B.

For purposes of the description the term “Net” means a group of pinsthat are connected together and are always at the same voltage. “LT”means less than and “GT” means greater than. Further, RMEAS meanscalculated resistance using V_(ref), R_(test), and V_(test), asdescribed hereinabove. “RCONT” means the continuity threshold testresistance (test limit), and RISOL means the isolation threshold testresistance (test limit).

In regards to pins intended to be connected, if the measured resistancein a wire is less than RCONT then the connection is operating properly,as indicated by arrow 1390. However, if the resistance is greater thanRCONT and less than RISOL, this indicates a high resistance connection,as indicated by arrow 1391, which indicates a fault. Further, if theresistance measured is greater than RISOL, this indicates that the pinis not connected, as indicated by reference arrow 1392, which indicatesa fault.

In regards to nets not intended to be connected, if the measuredresistance in a wire is less than RCONT this indicates a miswire, asindicated by arrow 1394. Further, if the resistance is greater thanRCONT and less than RISOL, this indicates an isolation failure, asindicated by arrow 1395, which indicates a fault. However, if theresistance measured is greater than RISOL, this indicates that the pinsare operating properly.

Each of the faults described above are now defined. In this regard, a“miswire” fault, as shown in arrow 1393 is when a pin is connected toanother net with resistance less than RCONT. The Value of RCONT used forthis particular test is the largest value specified for the wirelist,e.g., RCONT shown in the data 600 (FIG. 6 ) or 700 (FIG. 7 ).

An “isolation fault” is shown with reference to arrow 1394. An isolationfault is when a net is connected to another net with greater than theRCONT and less than RISOL.

A “not connected fault” is shown with reference to arrow 1392. A notconnected fault means the resistance between two pins intended to beconnected is greater than RISOL.

A “high resistance connection fault” is indicated by arrow 1391. A highresistance connection fault is when the resistance between two pinsintended to be connected is greater than RCONT and less than RISOL.

FIG. 13B depicts exemplary architecture and functionality of anexemplary testing of wires in accordance with an embodiment of thepresent disclosure. The following flowchart describes tests performed atthe direction of host control logic 402 (FIG. 4 ) and/or remote controllogic 502 (FIG. 5 ) based upon a test program selected by an operator ofthe host testing device 101 (FIG. 4 ).

At step 1300, all pins are connected to ground on the host testingdevice 101 and the remote testing device 102 (FIG. 12 ) except thosepins on the test net, i.e., the wires being tested. In this regard, thehost control logic 402 transmits data indicative of grounding all wiresexcept the wire being tested to the remote control logic 502. Inresponse, the remote control logic 502 signals the circuitry to groundall wires except the wire being tested. In addition, the host controllogic 402 signals the circuitry 800 resident on the host testing device101 to ground all wires except the wire under test. As describedhereinabove, the host control logic 402 uses the cable data 405 thatcomprises wiring topology to identify test nets and identify pins forgrounding.

Further, in step 1301, all pins corresponding to wires being tested onone net are open, e.g., switches 802 ₁, 802 ₂, and 803 ₃ are open inFIG. 12 . Note that the host control logic 402 transmits a commandand/or instruction to the remote control logic 502 to open all switchescorresponding to the net being tested. The control logic 502 uses thecable data 405 (FIG. 4 ) to determine what pins, and hence whatswitches, are to be actuated to effectuate this step.

In step 1302, one pin, W1 (FIG. 12 ) on the test net, i.e., W1, W2, andW3, is connected to V_(ref) 906 (FIG. 12 ). In performance of this step,the host control logic 402 directs the circuitry 800 to connect the pinto the reference voltage. The host control logic 402 uses the cable data405 to determine which pin, and hence which wire, is to be connected tothe reference voltage.

In step 1303, the host control logic 402 calculates a resistance andcompares the calculated resistance of the wire being tested to RCONT. Ifthe calculated resistance (RMEAS) is not greater than the continuityresistance test limit (RCONT), then the control logic 402 (FIG. 4 )stores data indicative of a miswire fault in step 1305 in the test data404 (FIG. 4 ). Note that a “miswire” means that one pin on the test netis connected to another net with resistance less than the continuityresistance test limit, as is described with reference to FIG. 13B.Further note that the value of RCONT used for this test is the largestvalue specified for the wirelist indicated by the installer via theinput interface 407 (FIG. 4 ), the excel spreadsheet uploaded to thehost testing device 101, or a tester global value.

If the calculated resistance is greater than the continuity resistancetest limit, the host control logic 402 compares the measured resistanceto the isolation resistance test limit (RISOL) in step 1304. If thecalculated resistance is not greater than the isolation resistance testlimit in step 1304, the control logic 402 stores data indicative of anisolation fault in the test data 404. Note that an isolation fault meansthat the net is connected to another net or group of nets with greaterthan the continuity resistance test limit and less than the isolationresistance test limit, as described with reference to FIG. 13A.

If the calculated resistance is greater than the isolation resistancetest limit in step 1304, then the host control logic 402 tests the nextpin in the test net as indicated in step 1307. In this regard, the testbegins again at step 1301. If all the pins in the test net have beentested, the host control logic 402 tests the next test net on thecable-under-test in step 1308. In this regard, the test begins again atstep 1300.

If all the test nets in the cable-under-test have been tested, thecontinuity test is performed. In this regard, at step 1310 all pins areconnected to ground except the test net pins. In step 1311, all pins onthe test net are opened.

In step 1312, one pin on the wire being tested is connected to V_(ref)906, and the other pin is connected to ground. If the calculatedresistance is not less than the isolation resistance test limit in step1313, the control logic 402 stores data indicative of a “not connectedfault,” which means that the resistance between two pins intended to beconnected is greater than the isolation resistance test limit.

If the calculated resistance is less than the isolation resistance testlimit in step 1313, the calculated resistance is tested versus thecontinuity resistance test limit in step 1315. If the calculatedresistance is not less than the continuity resistance test limit in step1315, the control logic 402 stores data indicative of a “high resistanceconnection fault,” which means that the resistance between two pinsintended to be connected is greater than the continuity resistance testlimit and less than the isolation resistance test limit.

If the calculated resistance is not less than the isolation resistancetest limit in step 1313, the control logic 402 stores data indicative ofa not connected fault in step 1314, which means that the resistancebetween the two pins intended to be connected is not less than isolationresistance test limit.

If the measured resistance is less than the continuity resistance testlimit in step 1315, the control logic 402 determines if both pins on awire have been tested, as indicated in step 1319. If not, the controllogic 402 reverses the pin connections of wires, as indicated in step1320, and tests the other pin connection by starting the flow again atstep 1313.

If both pins have been tested in step 1319, the control logic determinesif all wires in a net have been tested in step 1317. If no, the controllogic 402 returns back to 1311 to test the additional wires. If yes, thecontrol logic 402 determines if all nets have been tested. If no, thecontrol logic 402 returns to step 1310 to test the remaining nets. Ifyes, the test is completed. All wires of all nets have been tested.

FIG. 14 is a flowchart of an exemplary download of cable data 405 (FIG.4 ) of the system 100 (FIG. 1 ). In this regard, in step 1400 aninstaller (or other use of the computer 121 (FIG. 1 )) generates a cablenet list (cable data 405), for example in a spreadsheet as is shown inFIGS. 6 and 7 . In step 1401, the installer saves the cable data 405locally on the computer 121 (FIG. 1 ).

Via a link, e.g., a universal serial bus, a Bluetooth transceiver, anEthernet connection, or the like, the installer downloads the cable data405 to the host testing device 101 (FIG. 1 ), as indicated in step 1402.Once the cable data 405 is downloaded to the host testing device 101,the test is ready for execution, as indicated in step 1403.

FIG. 15A depicts a front view of an exemplary testing device 1500 thatmay be used as the host testing device 101 (FIG. 1 ) or remote testingdevices 102-106 (FIG. 1 ). The testing device 1500 comprises atouchscreen 1501 to be used as the output interface 408 (FIG. 4 ) andinput interface 407 (FIG. 4 ). Note that attached hereto is Appendix Athat describes various displays depicting input/output via thetouchscreen 1501.

Additionally, the device 1500 comprises wireless sensor interfaces 1501.The wireless sensor interfaces 1501 may be used to communicate withcustom or third-party wireless sensors. In addition, the wireless sensorinterfaces 1501 allow the device 1500 to manage multiple wirelesssensors.

In one embodiment, the device 1500 comprises ports 1503 such that thedevice 1500 can measure voltage, current, capacitance, and resistance.With a smart adapter having a plurality of spring contacts, the device1500 may use the ports 1503 to set-up, test, and view multiple inputssimultaneously. The ports 1503 further allow the device 1500 to initiateand view output of remote multimeters. Note that the term “smartadapter” is a collection of electronics, for example on a printedcircuit board, that are configured for performing a particular function.In regards to the present disclosure, the smart adapter may, forexample, be configured to performing radio-frequency testing.

FIG. 15B is a side view of the device 1500 showing a BayonetNeill-Concelman (BNC) connector 1505. Such device 1505 may be configuredto initiate time-domain reflectometry (TDR) functionality to detectdistance to an open circuit or distance to short circuit. In addition,the connector 1505 may be used to verify the length of cable. Thus, theBNC connector 1505, combined with the testing features describedhereinabove, may be used to determine an exact fault in acable-under-test.

In one embodiment, the control logic, e.g., host control logic 402 (FIG.4 ), is configured for receiving data indicative of a map of the systembeing tested. The map data may be a computer-aided drawing of thesystem. As noted, the TDR may determine the distance to an open or shortcircuit. In such an embodiment, the control logic searches the map datato determine where in the map data the open circuit or short circuit islocated based upon the distance data measured by the TDR. The controllogic then displays to an operator the map showing the location on themap of the open or short circuit.

FIG. 15C depicts a back view of the device 1500. Notably, the device1500 comprises a connector 1506 for connecting the device 1500 to anadapter cable as described hereinabove. Further as described, the device1500 comprises a module 1507 that may be field interchangeable, i.e.,interchangeable in the field, so that the device 1500 may connect to a128-pin connector with one type of module or connect to a plurality ofspring contacts with another type of module. Thus, the adapter module1507 generally provides the hardware for connecting the device 1500 to acable-under-test, whether a 128-pin connector or a plurality of springcontacts.

Note that the adapter module 1507 may be other types of modules in otherembodiments. For example, the adapter module 1507 may contain electroniccircuitry (not shown) that comprise hardware for electronic signalstimulus, measurement capabilities, or direct current to opticalfrequency translation. Adapter operation may be controlled via thetouchscreen 1501. Further, software for controlling one or more types ofadapter modules may be stored in memory 401 (FIG. 4 ). Some adapters maycontain user-configurable features, such as electronic circuits,indicators, computer processors, data bus, and memory.

Additionally, while not specifically shown in FIG. 15B, the housing ofthe device 1500 may further comprise a flashlight. The flashlight wouldbe powered by the internal battery or other power source. Further, itmay be located, for example, at location 1580 on the housing of thedevice 1500.

FIG. 16 depicts a system 1600 in accordance with an embodiment of thepresent disclosure. The system 1600 comprises a plurality of testingdevices 1603-1607 such as have been described hereinabove. As isdescribed hereinabove, the testing devices 1603-1607 may be used to testsystem components on a vehicle, including, but not limited to cables andother electronic components.

In this regard, the devices 1603-1607 may be used to measure andcalculate test results, which are stored resident on the devices1603-1607 as test data 404 (FIG. 4 ) in memory 401 (FIG. 4 ). In suchembodiment, each of the devices 1603-1607 comprises a wirelesstransceiver 409 (FIG. 4 ) for connecting to a computer, a computernetwork, or the Internet 1601 via a communication device 1608. As anexample, the communication device 1608 may be a router. Note that thewireless transceiver is to be broadly construed to cover any type ofsoftware or hardware that connects the devices 1603-1607 to a networkfor transmitting and receiving data from a central server and/or theInternet. As an example, the transceiver 409 may communicatively couplethe testing devices 1603-1607 to a cellular and/or data network.

The system 1600 further comprises a computer network, internet or cloudservers 1602. The computer network, internet or cloud servers 1602 isany type of computing device known in the art or future-developed. Thecomputing device 160 communicates with the devices 1603-1607 over theInternet 1601. In this regard, the devices 1603-1607 may transmit dataindicative of test data 404 to the computer network, internet or cloudservers 1602.

The computing device 1602 may store the test data 404 received from thedevices 1603-1607. The computer network, internet or cloud servers 1602may be configured to display the data 404 to a user for analysis orgenerate reports based on the test data 404.

Additionally, the computing device 1602 may transfer data to the devices1603-1607. In this regard, the computer network, internet or cloudservers 1602 may transfer data indicative of a test routine to beexecuted, upgrades, technical information, or other programs, which isdescribed further with reference to FIGS. 17, 18 and 19 . In addition,control logic 402, control logic 502, configuration data 403, test data404, and cable data 405 may also be transferred to the devices1603-1607. Such data may be viewed on the devices 1603-1607.

FIG. 17 depicts another embodiment of an exemplary testing device 1700that may be used as either a host testing device or a remote testingdevice (such as described with reference to FIGS. 1-16 ). FIG. 17 issubstantially similar to both FIGS. 4 and 5 . The testing device 1700shall be described herein as being a host testing device, similar to theone depicted in FIG. 4 ; however the functionality described herein mayalso be applied to a remote testing device as described in FIG. 5 .

The notable difference between the testing device 1700 and the testingdevices of FIGS. 4 and 5 is that the testing device 1700 comprises amicrocontroller 1701. In one embodiment, the microcontroller 1701 is aprinted circuit board (not shown) that is inserted in the testing device1700. For clarity, reference numerals for components common to thetesting device 1700 and the testing devices of FIGS. 4 and 5 are used inthe following description.

The testing device 1700, similar to the testing devices depicted inFIGS. 4 and 5 , comprises the processor 400 and memory 401. In addition,the testing device 1700 comprises the input interface 407, and theoutput interface 408 (e.g., an LCD display device), which behave asdescribed with reference to FIG. 5 . Further, the testing device 1700comprises the cable interface connector 410 and the battery 412.

The processor 400 communicates with the components, including the memory401, the computing device interface 411, the input interface 407, theoutput interface 408, and the cable interface connector 401, over thebus 406. During operation, the testing device 1700 may be coupled to acable-under-test 107-112 (FIG. 1 ), as described hereinabove. The hostcontrol logic 402 controls communication with multiple remote testingdevices 102-106 (FIG. 1 ) in running various tests, describedhereinabove, to ensure the integrity of each of the cables 107-112. Inthis respect, the testing device 1700 operates as described withreference to the host testing device 101 (FIG. 1 ) and the remotetesting devices 102-106.

Note that different than the remote testing devices and host testingdevices described hereinabove with reference to FIGS. 4 and 5 , theexemplary testing device 1700 comprises the microcontroller 1701, asindicated hereinabove. The microcontroller 1701 provides additionalfunctionality not described hereinabove with reference to theembodiments of testing devices described with reference to FIGS. 4 and 5. Such additional functionality is described hereinafter with referenceto FIGS. 18 and 19 .

FIG. 18 is a block diagram of an exemplary microcontroller 1701. Notethat the host testing devices and remote testing devices describedhereinabove with reference to FIGS. 4 and 5 do not utilize amicrocontroller 1701.

The microcontroller 1701 comprises at least a processor 1800, memory1801, and a communication interface 1804. In one embodiment, themicrocontroller 1701 is a TX53 printed circuit board (PCB) card, and theprocessor 1800 is Freescale i.MX535. However, other types of PCBs andother types of processors are possible in other embodiments.

The exemplary memory 1801 may be random access memory (RAM) and/or readonly memory (ROM). Note that other types of memory may be used in otherembodiments of the exemplary memory 1801.

In the embodiment depicted in FIG. 18 , memory 1801 comprises operatingsystem logic 1802. In one embodiment, the operating system logic 1802 isa LINUX operating system. However, other types of operating systems maybe used in other embodiments. For example, the operating system logic1802 may be Android °, Windows °, or any other type of operating systemknown in the art or future-developed.

In addition, memory 1701 comprises user document data 1807. The userdocument data 1807 may include, but is not limited to, data indicativeof schematics, wiring diagrams, system operating manuals, systemtroubleshooting procedures, test procedures, and/or repair procedures.As will be described further, the user document data 1807 is any type ofdata that assists the user of the testing device 1700 (FIG. 17 ) in thetesting and diagnostics of a vehicle, e.g., the CH47 depicted in FIG. 1. In one embodiment, the user document data 1807 may also comprise videodata.

The memory 1801 may further comprise application logic 1807. In oneembodiment, the application logic 1807 may be Adobe® logic, In thisexample, the Adobe logic 1807 may display user document data 1807 thatis in an Adobe format to the output interface 408 (FIG. 17 ). Theapplication logic 1807 may be other types of logic, including logic fordisplaying video to the output interface 408. In this regard, types ofvideo formats include, but are not limited to, AVI, MP3 and 4 and Flash.As additional examples, the application logic may be Microsoft Word®,Mentor®, National Instruments®, Keysight®, and the like.

The communication interface 1804 is any type of interface that enablesthe processor 1700 to communicate with the testing device's bus 406,also shown in FIG. 17 . In this regard, data is transmitted by theprocessor 1800 through the communication interface 1804 to the processor400 (FIG. 17 ). Additionally, the processor 1800 may transmit userdocument data 1807 to the output interface 408 (FIG. 17 ) via thecommunication interface 1804. Further, the processor 1700 may receiveparticular data from the input interface 407 (FIG. 17 ) to be stored asuser document data 1807.

In the embodiment depicted in FIG. 18 , the microcontroller 1701 furthercomprises a universal serial bus (USB) interface 1803 and a wirelesstransceiver 1805. Both the USB interface 1803 and the wirelesstransceiver 1805 may be used to receive data indicative of user documentdata 1807.

In the embodiment shown, the processor 1800 may access any of theperipherals shown in the testing device 1700. As mere examples, theprocessor 1800 may access the input interface 407, the output interface408 (which includes a liquid crystal display (LCD) device and/or audiooutput), the transceivers 413 and 409, the cable interface connector 410or the memory 401.

During operation of the testing device 1700, the host control logic 402(FIG. 17 ) (or the remote control logic 502 if the device is a remotetesting device as shown in FIG. 5 ), may transfer control of the testingdevice 1700 from the processor 400 (FIG. 17 ) to the processor 1800.

Thus, the user may access any user document data 1807 stored in memory1701 of the microcontroller 1701. As an example, the user may be testingthe wiring of the CH47 shown in FIG. 1 . The user document data 1807 mayinclude a wiring diagram of the CH47. Thus, the user, in testing thecables of the CH47, may view the wiring diagrams or schematics stored inthe user document data 1807. Note that the diagrams will allowpinch-zoom and scroll using a touchscreen input interface 407 (FIG. 17).

The inclusion of the microcontroller 1701 into the testing device 1700and the capability to transfer control from the processor 400 (FIG. 17 )to the processor 1800 provides additional functionality to a user of thetesting device 1700.

In one embodiment, a developer of software for the testing device 1700may access the microcontroller 1701, for example through the USBinterface 1803 or the wireless transceiver 1805. In this regard, thedeveloper may couple electronically a monitor (not shown), a keyboard(not shown), and/or a mouse (not shown) (collectively referred to as“development hardware) via the USB interface 1803. Note that variousinterfaces may be used to interface a development environment with themicrocontroller 1701. In this regard, a universal asynchronousreceiver/transmitter (UART), a serial peripheral interface (SPI) or SPIbus, or an inter-integrated circuit (I2C) may be employed in themicrocontroller 1701 to provide a communication link to themicrocontroller 1701 by the development hardware. Note that these areexemplary hardware/software configurations that enable developerhardware to interface with the microcontroller 1701. Other types ofconfigurations may be employed in other embodiments.

Further, the USB interface 1803 may be used to transfer data files(e.g., user document data 1807) or other control logic to themicrocontroller 1701. The USB interface 1803 may further be used tointerface the microcontroller 1701 to a network (not shown) so that auser may access the memory 1801 for downloading user document data 1807or logic to the microcontroller 1701.

The wireless transceiver 1805 may also be used to receive user documentdata 1807 or other types of control logic (not shown). The wirelesstransceiver 1805 may further be used to interface the microcontroller1701 to a network (not shown) so that a user may access the memory 1801for downloading user document data 1807 or logic to the microcontroller1701. Additionally, the wireless transceiver 1805 may connect with othercomputer networks (not shown) or the Internet 1601 (FIG. 16 ).

Note that the memory 1801 may comprise mass storage functionality. Inthis regard, the memory may contain large sectors of data, files, and/orlogic for providing user of the testing device 1700 data or controllingthe operation of the microcontroller 1701.

Further, the microcontroller 1701 may be equipped with an Ethernetinterface 1809. The Ethernet interface 1809 may be used to transferdata, files, and/or control logic to the microcontroller 1701. Further,the Ethernet interface 1809 may be used to interface the microcontroller1701 with a network.

The microcontroller 1701 further comprises a Bluetooth® transceiver 881.The Bluetooth® transceiver 881 enables the microcontroller 1701 tocommunicate short-range with cellular phones, computers, or otherelectronic devices.

In one embodiment, the microcontroller 1701 may be electrically coupledto a printer. In this regard, a printer may interface microcontroller1701 through the USB 1803, the Ethernet interface 1809, or the wirelesstransceiver 1805.

FIG. 19 depicts exemplary data flow of the testing device 1700 depictedin FIG. 17 , inclusive of the microcontroller 1701. For purposes ofdescription, the data flow chart comprises a test and measurementcomputing device 1904, which is inclusive of the processor 400 (FIG. 17) and the control logic 402 (FIG. 17 ). In this regard, operations takenby the test and measurement computing device 1904 are performed in theexemplary embodiment by the processor 400 and the control logic 402.Further, data obtained from measurements or configuration data used forpurposes of data flow are stored in memory 401 (FIG. 17 ).

Likewise, for purposes of description, the data flow chart comprises acomputing and document display computing device 1905, which is inclusiveof the processor 1800 (FIG. 18 ) and the microcontroller control logic1820 (FIG. 18 ). In this regard, operations taken by the computingdevice 1905 are performed in the exemplary embodiment by the processor1800 and the control logic 1820.

During operation, the test and measurement computing device 1904 mayinitiate measurements of a system component. With reference to the dataflowchart, the computing device 1904 may start a measurement byactivating a time-domain reflectometer (TDR) 1901. The reflectometer1901 transmits a signal onto the system component, e.g., acable-under-test, and obtains data indicative of reflections along thecable-under-test, if any. Such data is collected and stored by thecomputing device 1904.

Likewise, the computing device 1904 may start a measurement byactivating a digital multi-meter (DMM) 1902. The DMM 1902 measures, forexample, direct current voltage, alternating current voltage, currentand/or resistance in the cable-under test. Such data is collected andstored by the computing device 1904.

Further, other test such as are described herein with reference totesting devices shown in FIGS. 4 and 5 may also be performed on systemcomponents. In this regard, the computing device 1904 initiates a testof the test subsystem 1903. The test subsystem 1903 may be, for example,the circuitry 800 or 890 (FIG. 8 ) or adapter electronics that arecoupled to the test and measurement computing device 1904. The testsubsystem performs tests of the system component, and the computingdevice 1904 collects test data measured by the test subsystem 1903.

The measurement and test data are collected and stored by the computingdevice 1904. Note that the measurements taken by the TDR 1901, the DMM1902, or the test subsystem 1903 are initiated by an operator (notshown). In this regard, an operator interface 1915 may include a liquidcrystal display (LCD) and touch screen 1916. The operator may select oneor all of the various operations to be performed by the computing device1904 on the system component via the LCD and touch screen 1916.Furthermore, as measurement and test data are collected by the computingdevice 1904, the measurement and test data may be displayed to the LCDand touch screen 1916.

During operation, the computing and document display computing device1905 may request test and measurement data from the computing device1904, and the computing device 1904 provides data indicative of themeasurement and test data to the computing device 1905. Further, basedupon an operator input, the computing device 1904 may transfer controlof the operator interface 1915 to the computing device 1905.

Based upon operator inputs received from the LCD and touch screen 1916,the computing device 1905 can perform a wide variety of functions.Notably, the computing device 1905 may interface with a printer 1914.Thus, the operator may print measurement and test data to the printer1914. As will be described further herein, the computing device 1905 mayalso receive testing manuals, operator manuals or other documentationrelated to the system component or system being tested. Thus, theoperator may also print such test manuals, operator manuals or otherdocumentation to the printer 1914.

As is described with reference to FIG. 18 , the computing device 1905may comprise an Ethernet interface 1809 (FIG. 18 ) that interfaces withEthernet 1913. Thus, the computing device may transmit data files and/orprograms via the Ethernet to another device, e.g., a laptop or desktopcomputer, a printer (such as printer 1914), a storage device (such asstorage device 1912).

Additionally, the computing device 1905 may directly interface with anonresident storage device 1912. In this regard, the computing device1905 may store data files and/or programs on the storage device 1912.

The computing device 1905 may interface with wireless radio 1911. Asdescribed with reference to FIG. 18 , the microcontroller 1701 may havean onboard wireless transceiver 1805 (FIG. 18 ) with which to interfacewith the wireless radio 1911. Thus, the computing device 1905 maytransmit data files and/or programs via wireless radio 1911 to otherdevices, for example a laptop or desktop computer, a handheld device(e.g., a cellular telephone), or a wireless network (not shown). Notethat the computing device 1905 may connect with other components shownin the data flow chart, such as, for example the printer 1914, via thewireless radio 1911.

Further, the computing device 1905 may transmit data files and/orprograms over a universal serial bus 1910. As described with referenceto FIG. 18 , the microcontroller 1701 may comprise a USB interface 1803that interfaces with the USB 1910.

In addition, the computing device 1905 may connect to a developmentinterface 1901, which includes a monitor 1906, a keyboard 1907, and amouse 1908. Note that the computing device 1905 may connect to thecomponents of the development interface 1909, for example, through theUSB 1910, the wireless radio 1911, the Ethernet 1913, or any otherdedicated connection that allows access to the computing device 1905. Inregards to the development interface 1901, a developer (not shown) maydevelop control logic 1820 (FIG. 18 ) for implementation and executionby the computing device 1905.

The architecture and functionality of the foregoing device 1700 (FIG. 17) comprising the microcontroller 1701 (FIGS. 17 and 18 ) and the dataflow depicted in FIG. 19 is now described with reference to FIG. 20 .Furthermore, FIG. 16 is applicable to the following description andappropriate reference numerals from FIG. 16 will also be used in thefollowing description.

In step 2000 an operator initiates tests on a component, e.g., a cableor other electronic component, using the testing device 1700 (FIG. 17 ).As described hereinabove, tests may be performed on a system component,e.g., a cable, using the test subsystem 1903 (FIG. 19 ), a TDR 1901(FIG. 19 ), a DMM 1902 (FIG. 19 ) or adapter electronic functions. Notethat the identified devices for testing the system component areexemplary, and other devices and/or methods may be used to test thesystem component and receive operational data indicating the integrityof the system component. While the present disclosure provides anexemplary system component, i.e., a cable-under-test, the testing device1700 may also be used to test other system components other than cables.

In step 2001, the test and measurement computing device 1904 receivestest and measurement data from the subsystem 1903, the TDR 1901, the DMM1902, or adapter electronics. In addition, the computing device 1905requests the test and measurement data from the computing device 1904.The computing device 1905 determines, based upon the data received, ifthe system component is working properly.

If the tester or computing device 1905 determines that the test andmeasurement data indicate an error and the tester identifies the errorin documentation onboard the testing device 1700, as indicated in step2001, the computing device 1905 retrieves documentation related to theidentified error from onboard memory 401 (FIG. 17 ) or memory 1801 (FIG.18 ), as indicated in 2002. Note that the documentation retrieved maycomprise a variety of technical information, including a series ofoperational questions and corresponding answers to the questions,diagnostic information, repair information, and/or retestinginformation. Notably, the technical information retrieved is based uponthe error identified by either the operator or the computing device1905. In one embodiment, the operator may manually respond to thequestions or the testing device 1700 may automatically take additionalmeasurements based upon the documentation. Such documentation ishereinafter referred to as “smart” documentation or “smart” procedures.Regardless, the operator, in conjunction with automated process on thetesting device 1700, may walk through a series of questions andinquiries to determine a cause of malfunction or otherwise.

As indicated, in one embodiment, documentation related to the error isstored in memory 1801 (FIG. 18 ) as user document data 1807 (FIG. 18 ),and the computing device 1905 retrieves the documentation from theresident memory 1801. In one embodiment, the documentation data 1807 maybe a portable document format (.pdf) file, and the control logic 1820(FIG. 18 ) executes application logic 1808 to display the documentation1807 to the display and touch screen 1916. Note that the user documentdata 1807 may be in any type of format known in the art orfuture-developed. In this regard, the document data 1807 may beinteractive, as described hereinabove. In this regard, the document data1807 may display text having hyperlinks to allow the operator to pull upadditional information or documents either resident on the testingdevice 1700, microcontroller 1701, or via the Internet 1601 (FIG. 16 )from the computer network, internet or cloud servers 1602. Furthermore,in step 2003, the computing device 1905 displays the retrieveddocumentation to the operator via the LCD and touch screen 1916.

In step 2007, an operator repairs the component based upon the technicalinformation received from onboard memory 401 or 1801. Thereafter, theoperator performs testing on the repaired component, in step 2008.

If the repairs suggested by the onboard technical information fixes theerror in the system component, as indicated in step 2009, the testingdevice 1701 stores data indicative of the test sequence, measured data,and diagnosis in memory 401 or 1801, as indicated in step 2016.Thereafter, this data is uploaded to the computer network, internet orcloud servers 1602, as indicated in step 2017, and documentation andinstructions at the computer network, internet or cloud servers 1602 maybe modified accordingly to reflect the error in the component, thediagnosis, and the test and repair sequence, as indicated in step 2018.Modified procedures based upon the data may then be downloaded andreceived by the testing device 1700, as indicated in step 2019.

Note that in one embodiment, the data indicative of the repair may beuploaded via the wireless radio 1911 (FIG. 19 ), the Ethernet 1913 (FIG.19 ), the USB 1910 (FIG. 19 ) or the Bluetooth® transceiver 1881 (FIG.18 ) to the Internet 1601 (FIG. 16 ) and to the computer network,internet or cloud servers 1602 (FIG. 16 ). The server may then use thedata received to automatically update the documentation or thedocumentation may be refined and edited manually in response to the datareceived related to the use of the documentation in the repair of thecable-under-test.

If in step 2001 the operator or computing device does not identify theerror, the testing device 1701 retrieves technical information relatedto diagnostic procedures from the computer network, internet or cloudservers 1602, as indicated in step 2011 related to the particular errorreceived. As noted hereinabove, the technical information may include“smart” documentation or “smart” procedures that aid the operator indiagnosing an error on the component being tested.

In step 2012, additional testing may be performed based upon thetechnical information retrieved from the computer network, internet orcloud servers 1602, which may suggest a particular test be performed toidentify the error. In one embodiment, the computing device 1904performs the additional testing automatically based upon the technicalinformation. In another embodiment, the computing device 1904 may directthe operator to troubleshoot other subsystem components, e.g., powersupplies, computing, communication, aviation black boxes, etc. using thetester on-board and optional plug-in adapter measurement components.

In step 2013, the computing device 1904 receives data indicative of theadditional testing. In this regard, the operator may enter data or thetester may automatically test and obtain test data.

In step 2014, based upon the testing data received, the computing device1905 may direct the operator to take additional measurements or maydisplay diagnosis and repair procedures or other technical informationrelevant to diagnosing and/or fixing the error identified.

In step 2015, if the repair procedures employed at the direction of thedocumentation repaired the components, the testing device 1701 storesdata indicative of the test sequence undergone during the procedure,measured data and diagnosis. The computing device 1905 then uploads thisstored data to the computer network, internet or cloud servers 1602(FIG. 16 ). Upon receipt of the stored data by the computer network,internet or cloud servers, the computer network, internet or cloudservers 1602 may modify the procedures or any other data received asindicated in step 2018, and download the modified procedures to thetester or a field of testers, as indicated in step 2019. Therefore, thecomputing device 1905 receives the modified procedures from the computernetwork, internet or cloud servers 1602. Notably, the newly modifiedprocedures may be used in future testing and troubleshooting performedwith the computing devices 1904, 1905 or by the operator.

FIG. 21 depicts a wire and cable high voltage insulation testing system2100 in accordance with an embodiment of the present disclosure. Thesystem 2100 performs testing on a cable 2106 to determine if insulationof the cable 2106 has been compromised. The system 2100 comprises a hostcontroller device 2101 that is communicatively coupled via a wirelesslink 2107 to a high voltage insulation testing device 2101. The hostcontroller device 2101 transmits test commands to the testing device2101 over the wireless link 2107, and in response, the testing device2102 performs tests on the cable 2106. Note that in the system 2100,because communication between the host controller device 2101 and thetesting device 2101 is wireless, there is no galvanic connection betweenthe host controller device 2101 and the testing device 2102. Thus, thereis no risk that an operator of the host controller device 2101 will beexposed to any high voltages that are used in testing.

The testing device 2102 comprises adaptor 2103 that couples to the cable2106 via a connector 2105 at a first end of the cable 2106 and aconnector 2104 at a second end of the cable 2106. Note that the adaptor2103 may connect to a multiple pin connector. For example, the testingdevice 2102 may comprise a 128-pin connector, and the adaptor 2103couples to the 128-pin connector.

During operation, the testing device 2102 is controlled by the hostcontroller 2101. The host controller device 2101 transmits testingcommands to the testing device 2102 via the wireless link 2107. Thecommands transmitted define the test to be performed on the cable 2106by the testing device 2102.

As an example, the host controller device 2101 transmits data via thewireless link 2107 indicative of a high voltage, e.g., 1000 Volts (V),to be applied to the cable 2106. Additionally, the host controllerdevice 2101 transmits data indicative of a test limit, e.g., 2 milliamps(mA). In the example, in response to receiving the data indicative ofthe voltage and the test limit, the testing device 2102 applies theindicated high voltage to a wire of the cable 2106 via the connector2104, and connects all other wires to a common ground reference. Thetesting device 2102 measures the amperage from the high voltage wire tothe grounded wires of the cable 2106 via the connector 2105, andcompares the measured amperage to the test limit. In the exampleprovided, if the measured amperage is greater than the test limit, thisindicates that there was an insulation failure.

The host controller device 2101 may transmit other data indicative ofother commands to the testing device 2102. For example, the datatransmitted by the host controller device 2101 may indicate a start timefor the test, a duration of the test, and/or which pins on the adapterare grounded and to which pins to apply voltage.

Thus, the testing device 2102 tests the operability and functionality ofthe cable 2106 to determine the integrity of the insulation on the cable2106. The testing device 2102 records the results of the testing andtransmits the results to the host controller device 2101.

FIG. 22 depicts another wire and cable high voltage insulation testingsystem 2200 in accordance with another embodiment of the presentdisclosure. The system 2200 comprises a host controller device 2201 thatis communicatively coupled to three testing devices 2202-2204 viawireless links 2209-2211, respectively. Note that three testing devices2202-2204 are shown for exemplary purposes. The system 2200 may comprisemore or fewer testing devices in other embodiments of the presentdisclosure.

Each testing device 2202-2204 comprises a respective adaptor 2205-2207that couples each testing device 2202-2204 to a portion of a highvoltage cable 2208 via respective connectors 2212-2214. Note that theadaptors 2205-2207 may connect to a multiple pin connector. For example,the testing devices 2202-2204 may comprise a 128-pin connector, and theadaptors 2205-2207 couple to the 128-pin connector.

During operation, the testing devices 2202-2204 are controlled by thehost controller device 2201. In this regard, the host controller device2201 transmits testing commands to the testing devices 2202-2204 via thewireless link 2107. The commands transmitted by the host controllerdevice 2201 define the test to be performed by the testing devices2202-2204.

Similar to the single testing device system 2100 discussed withreference to FIG. 21 , the host controller device 2101 may transmit datato the testing device 2202 to apply a particular voltage, e.g., 1000 V,to the cable 2208. In addition, the host controller device 2101 maytransmit data indicative of a test limit, e.g., 2 mA, to the testingdevice 2204. The testing device 2204 measures the amperage on the cable2208 in response to the high voltage being applied, and compares theamperage to the test limit. If the measured amperage is greater than thetest limit, this indicates that insulation on the cable 2208 iscompromised.

Thus, the testing devices 2202-2204 each test the operability andfunctionality of a portion of the cable 2208. The testing devices2202-2204 record the results of the testing and transmit the results tothe host controller device 2201.

FIG. 23 depicts a system 2300 in accordance with another embodiment ofthe present disclosure. The system 2300 tests a conductor cable 2307 forvoltage standing wave ratio (VSWR) and insertion loss for particularfrequencies, e.g., 1 MHz to 10 GHz.

The system 2300 comprises a host testing device 2301 that is similar inhardware, software, and functionality of the host testing device 101(FIG. 1 ) that has been described throughout the present disclosure.However, coupled to the host testing device 2301 is an adapter havinghardware, software, and/or firmware cable of testing radio frequencies.This adaptor may plug into an adapter interface on the host testingdevice 2301, which can be, for example, a 128-pin connector or a seriesof spring contacts that interface with connections on the adaptor. Thehost testing device 2301 comprises an operator interface 2308, which canbe, for example, a touchscreen.

Additionally, the system 2300 comprises a remote testing device 2302.The host testing device 2301 is communicatively coupled to the remotetesting device 2303 via a wireless link 2309.

Note that as described hereinabove with reference to host testing device101 and remote testing device 102, whether a testing device is a hosttesting device depends upon whether a test program has been selected. Inthis regard, control logic (not shown) similar to control logic 402(FIG. 4 ) may display a list of types of adapters to the operator, andthe operator may select an RF analyzer adaptor from the list.Additionally, the control logic may display a list of test programs, andonce a test program is selected from the list, the testing devicebecomes the host testing device 2301.

The host testing device comprises a radio frequency (RF) analyzer 2303that is coupled to one end of a cable 2307 via a connector 2305. Theremote testing device 2302 comprises a radio frequency (RF) analyzer2304 that couples to a second end of the cable 2307 via a connector2306. Note that in one embodiment, the RF analyzers 2303 and 2304 coupleto a multiple pin connector of the host testing device 2301 and theremote testing device 2302. In one embodiment, the host testing device2301 and remote testing device 2302 comprise a 128-pin connector thatcouples to the RF analyzers 2303 and 2304, respectively.

During operation, host testing device 2301 transmits commands via thewireless link 2309 to the remote testing device 2302. For example, thehost testing device may transmit data indicative of power applied to thecable 2307 through connector 2305. The RF analyzer 2303 appliesalternating current (A/C) power stimulus to the cable 2307. In response,the RF analyzer 2304 measures the power resulting from the stimulus viathe connector 2306. In one embodiment, the remote testing device 2302transmits data indicative of the power measured to the host testingdevice 2301 via the wireless link 2309. In response to receiving thedata indicative of the power measured, the host testing device 2301determines insertion loss by comparing the power in/power out ratio to atest limit.

In another embodiment, the host testing device 2301 may transmit acommand to the remote testing device 2302 instructing the remote testingdevice 2302 to terminate the cable (serve as a load only) to the cable2307 via the connector 2306. In such a test, the RF analyzer 2303applies a particular frequency (or range of frequencies) to the cable2307. Because the cable 2307 is terminated at the remote testing device2302, the RF analyzer 2303 can measure the resulting reflection of theapplied signal to determine VSWR. The remote testing device 2302transmits data indicative of the resulting reflection to the hosttesting device 2301. In response to receiving the data indicative of theresulting reflection, the host testing device 2301 compares the VSWRagainst a test limit and determines whether the cable being testedpasses or fails.

The host testing device 2301 may receive input from the operatorinterface 2308, e.g., as a touchscreen, for selecting the frequencyrange for a test of the cable 2307. Further, the host testing device2301 may display test results to the operator interface 2308.Additionally, the operator may input data indicative of pass/fail testlimits.

FIG. 24 depicts a system 2400 in accordance with an embodiment of thepresent disclosure. The system 2400 comprises a host testing device 2401that serves as a single tester.

The host testing device 2401 comprises an operator interface 2420 forreceiving input from a user (not shown) and displaying output to theuser. In this regard, the operator interface 2420 may comprise atouchscreen. In such an embodiment, the user may enter testingparameters via the operator interface 2420 to the host testing device2401. Further, the host testing device 2401 may display test results tothe user via the operator interface 2420.

The host testing device 2401 comprises an RF analyzer 2403 that iscoupled to a cable 2412 via connectors 2408 and 2409. The host testingdevice 2401 may be used to test insertion loss and VWSR of the cable2412.

As an example, to test the insertion loss using the single host testingdevice 2401, the host testing device 2401 transmits a signal to the RFanalyzer 2403 to apply power to the cable 2412 through connector 2408.In response to the application of power to the cable 2412, the RFanalyzer 2403 measures the resulting power through connector 2409. Thehost testing device 2401 compares the power applied to the resultingpower to determine insertion loss.

What is claimed is:
 1. A testing system, comprising: a host controllerdevice comprising a wireless transceiver configured for transmittingdata indicative of a test to be performed on a cable; at least onetesting device communicatively coupled to the host controller device viathe wireless transceiver, the testing device comprising an adaptorconfigured for connecting the testing device to a cable and logicconfigured for performing the test on the cable based upon data receivedfrom the host controller device.
 2. The testing system of claim 1,wherein the data indicative of the test to be performed comprises dataindicative of a high voltage for application to the cable.
 3. Thetesting system of claim 2, wherein the data indicative of the test to beperformed further comprises data indicative of a test limit.
 4. Thetesting system of claim 3, wherein the logic is further configured toapply the voltage to a first end of the cable, measure a currentresulting in a second end of the cable, and determine, based uponcomparing the measured current to the test limit, whether the insulationof the cable has been compromised.
 5. The testing system of claim 1,wherein there is no galvanic connection between the host controllerdevice and the testing device.